Cost Per Hour (Industry)
Cost Per Hour (Academic/Gov't)
JEOL JEM-2100plus TEM
The JEOL JEM-2100 plus TEM is a multipurpose, 200 kV analytical electron microscope with ultrahigh TEM resolution as high as 0.19 nm (in UHR configuration) and with STEM and EDS options.
Nanopatterning Visualization Engine (NPVE)
This is used in a Crossbeam® (FIB) system for NanoPatterning, which complements the imaging capabilities of the CrossBeam®.
Zeiss Auriga FIB/FESEM with EDX
AURIGA CrossBeam consists of a field emission scanning electron microscope (FE-SEM) with GEMINI column accompanied by a Focused Gallium Ion Beam (FIB) column that offers Cross-sectioning, Nanotomography, Nanopatterning, 3D-Analytics, and TEM lamella preparation. Additionally, the system allows for elemental characterization through energy-dispersive X-ray spectroscopy (EDS/EDX).
JEOL JSM-IT800 Schottky FESEM
The JSM-IT800 incorporates an "In-lens Schottky Plus field emission electron gun" for high resolution imaging to fast elemental mapping, and an electron optical control system "Neo Engine", as well as a system of seamless GUI "SEM Center" for fast elemental mapping.
Zeiss Libra TEM
Libra 120 Plus is an Energy Filter TEM that takes advantage of inelastically scattered electrons to offer additional imaging modes and enhanced image quality when compared with conventional TEMs. In addiiton, electron energy loss spectroscopy (EELS) capability is available for elemental analysis.
Zeiss Orion Plus Helium Ion Microscope
HIM is a relatively new scanning particle beam microscopy technique that operates on the same basic principles as scanning electron microscopes. However, HIM offers several advantages over conventional scanning electron microscopy. The relatively large mass of the helium ions results in very little diffraction when passing through the tiny apertures thereby resulting in extremely small (sub-nanometer) probes. Complementing this, the ions penetrate deeply into the specimen before scattering, resulting in finely localized secondary electron emission. These characteristics of HIM ultimately deliver its incredible 0.3 nm resolution and extremely high depth of field, surpassing conventional SEM. In addition to secondary electron detection, our HIM is outfitted with a Multichannel Plate Detector (MCP) used for detection of backscattered helium ions and providing excellent material contrasts. Also, imaging of non-conductive and non-coated materials e.g. most polymers and biological materials is improved upon with the addition of an electron flood gun used for charge compensation.
Leica UC7 Ultramicrotome
Leica EM UC7 Ultramicrotome provides easy preparation of semi- and ultrathin sections as well as perfect, smooth surfaces of biological and industrial samples for TEM, SEM, AFM and Light microscopy examination.
Agilent 5600LS AFM
The 5600LS AFM is well suited for imaging and mapping both large and small samples. A variety of Scanning Probe Microscopy (SPM) techniques are possible including contact mode, acoustic ac mode, phase imaging, current sensing, Scanning Tunneling Microscopy (STM), Lateral Force Microscopy (LFM), Kelvin Force Microscopy (KFM)/Electrostatic Force Microscopy (EFM), and Force Modulation Microscopy. In addition, Scanning Microwave Microscopy (SMM) enables complex impedance, capacitance, and dopant density measurements.
Leica Sputter Coater (AuPd/C)
Leica ACE200 is metal sputter and carbon deposition for SEM and TEM analysis.
South Bay Plasma Cleaner (O2/Ar)
The PC-2000 Plasma Cleaner allows simultaneous cleaning of a specimen and a specimen stage which minimizes and, in some cases, eliminates contamination of inorganic specimens analyzed via SEM, TEM, STEM and/or AEM.
Axio Imager Z2M upright Microscope
Axio Z2m is an upright materials microscope, utilizing multiple light sources and filters and allows for the collection of high resolution still images at 50-1,000x.
Cytoviva Darkfield and Hyperspectral Imaging
This instrument is designed to support optical and hyperspectral imaging of nanoscale sample elements in both materials and biological based matrices.
Hitachi S-4800 FESEM w/EDX
The S-4800 is a high-resolution scanning electron microscope (SEM) with cold field emission gun. With a maximum resolution of 1-2nm, it is equipped with energy-dispersive X-ray spectroscopy (EDS).
Zeiss EVO LS SEM
Zeiss EVO LS10 is a variable pressure scanning electron microscope (VP-SEM), Capable of 6nm resolution in high vacuum mode. In extended pressure mode, imaging can be done at set pressures up to 3000 Pa. If used in conjunction with the Deben CoolStage II, biological and other wet samples may be imaged using the variable pressure secondary electron (VPSE) or backscatter detectors. Elemental analysis using the Oxford Inca EDX can be done in all modes.
Zeiss - Axio Observer A1
The Observer A1 is an upright compound microscope that is fully equipped four channel wide-field fluorescence, bright-field, dark-field and polarized light microscopy.
Zeiss Z1 Spinning Disk Confocal
Zeiss Axio Observer Spinning Disc Confocal microscope has objectives ranging from 10X-100X and provides four channel laser excitation capability from the near UV into the near infrared range. In addition, the stage mounted temperature controlled CO2 chamber is capable of long term live cell imaging.
Evident FV3000 Confocal Microscope
The Evident FV3000 has highly efficient and accurate TruSpectral detection on all channels. It is optimized for live cell imaging with high sensitivity and low phototoxicity.
Buehler MetaServ 250 Grinder-Polisher
This instrument is used for metallographic specimen preparation.
Asylum MFP-3D Origin+ AFM
This instrument is capable of nanomechanical, nanoelectrical and electromechanical characterization.
Thermo 325a Rotary Microtome
This instrument is capable of cutting high-quality paraffin sections for tissue processing.
The service rate (staff labor) is $100 per hour for external for-profit organizations (industry) and $50 per hour for internal and external non-profit organizations (academic/government). All charges for service and for instrumentation are rounded to the nearest quarter hour.