JSIRT Core Facilities
JSIRT provides access to imaging and analytical instrumentation for nano and microscale lithography, nanomaterial fabrication, characterization, and computation, as well as hands-on training in a shared user environment. The fee-for-use based resources, tools, and labs are available to academic, industry, and government users through JSIRT. In addition to the labs and tools, users have access world-class specialized training and highly skilled staff. Remote service is available. The service rate (staff labor) is $100 per hour for external for-profit organizations (industry) and $50 per hour for internal and external non-profit organizations (academic/government). All charges for service and for instrumentation are rounded to the nearest quarter hour.
Full Equipment Listing
JSIRT offers access to a suite of advanced microscopy tools and resources, including equipment training, remote sample preparation and analysis, and new process and imaging consultations. In addition to a wide variety of visualization, characterization and fabrication tools with micro and nanometer scale controllability, JSIRT also provides expert-driven analysis through skilled research staff to address the needs of academic, industry and government users.
If a JSNN Technical Staff member is completing service work for a user, a per-hour service (labor) fee is added onto the per hour instrumentation fee. The service (labor) rate is $100 per hour for Industry users and $50 per hour for Academic/Government users.
Click the Full Equipment Listing Link to find the full listing of Advanced Microscopy tools and resources.
| JEOL JEM-2100 plus TEM | The JEOL JEM-2100 plus TEM is a multipurpose, 200 kV analytical electron microscope with ultrahigh TEM resolution as high as 0.19 nm (in UHR configuration) and with STEM and EDS options. | BL02A TEM Lab | 160.00 | 80.00 |
| Nanopatterning Visualization Engine (NPVE) | This is used in a Crossbeam® (FIB) system for NanoPatterning, which complements the imaging capabilities of the CrossBeam®. | BL02 FESEM Lab | 61.00 | 30.50 |
| Zeiss Auriga FIB/FESEM with EDX | AURIGA CrossBeam consists of a field emission scanning electron microscope (FE-SEM) with GEMINI column accompanied by a Focused Gallium Ion Beam (FIB) column that offers Cross-sectioning, Nanotomography, Nanopatterning, 3D-Analytics, and TEM lamella preparation. Additionally, the system allows for elemental characterization through energy-dispersive X-ray spectroscopy (EDS/EDX). | BL02 FESEM Lab | 80.00 | 40.00 |
| JEOL JSM-IT800 Schottky FESEM | The JSM-IT800 incorporates an "In-lens Schottky Plus field emission electron gun" for high resolution imaging to fast elemental mapping, and an electron optical control system "Neo Engine", as well as a system of seamless GUI "SEM Center" for fast elemental mapping. | BL02 FESEM Lab | 80.00 | 40.00 |
| Zeiss Libra TEM | Libra 120 Plus is an Energy Filter TEM that takes advantage of inelastically scattered electrons to offer additional imaging modes and enhanced image quality when compared with conventional TEMs. In addiiton, electron energy loss spectroscopy (EELS) capability is available for elemental analysis. | BL02A TEM Lab | 151.00 | 75.50 |
| Zeiss Orion Plus Helium Ion Microscope | HIM is a relatively new scanning particle beam microscopy technique that operates on the same basic principles as scanning electron microscopes. However, HIM offers several advantages over conventional scanning electron microscopy. The relatively large mass of the helium ions results in very little diffraction when passing through the tiny apertures thereby resulting in extremely small (sub-nanometer) probes. Complementing this, the ions penetrate deeply into the specimen before scattering, resulting in finely localized secondary electron emission. These characteristics of HIM ultimately deliver its incredible 0.3 nm resolution and extremely high depth of field, surpassing conventional SEM. In addition to secondary electron detection, our HIM is outfitted with a Multichannel Plate Detector (MCP) used for detection of backscattered helium ions and providing excellent material contrasts. Also, imaging of non-conductive and non-coated materials e.g. most polymers and biological materials is improved upon with the addition of an electron flood gun used for charge compensation. | BL02B Helium Ion Microscope Lab | 303.00 | 151.50 |
| Leica UC7 Ultramicrotome | Leica EM UC7 Ultramicrotome provides easy preparation of semi- and ultrathin sections as well as perfect, smooth surfaces of biological and industrial samples for TEM, SEM, AFM and Light microscopy examination. | BL02B Helium Ion Microscope Lab | 40.00 | 20.00 |
| Agilent 5600LS AFM | The 5600LS AFM is well suited for imaging and mapping both large and small samples. A variety of Scanning Probe Microscopy (SPM) techniques are possible including contact mode, acoustic ac mode, phase imaging, current sensing, Scanning Tunneling Microscopy (STM), Lateral Force Microscopy (LFM), Kelvin Force Microscopy (KFM)/Electrostatic Force Microscopy (EFM), and Force Modulation Microscopy. In addition, Scanning Microwave Microscopy (SMM) enables complex impedance, capacitance, and dopant density measurements. | BL03 AFM Lab | 73.00 | 36.50 |
| Leica Sputter Coater (AuPd/C) | Leica ACE200 is metal sputter and carbon deposition for SEM and TEM analysis. | BL04 Sample Prep Lab | 20.00 | 10.00 |
| South Bay Plasma Cleaner (O2/Ar) | The PC-2000 Plasma Cleaner allows simultaneous cleaning of a specimen and a specimen stage which minimizes and, in some cases, eliminates contamination of inorganic specimens analyzed via SEM, TEM, STEM and/or AEM. | BL04 Sample Prep Lab | 20.00 | 10.00 |
| Axio Imager Z2M upright Microscope | Axio Z2m is an upright materials microscope, utilizing multiple light sources and filters and allows for the collection of high resolution still images at 50-1,000x. | L104 NanoBioPhysics | 55.00 | 27.50 |
| Cytoviva Darkfield and Hyperspectral Imaging | This instrument is designed to support optical and hyperspectral imaging of nanoscale sample elements in both materials and biological based matrices. | L104 NanoBioPhysics | 61.00 | 30.50 |
| Hitachi S-4800 FESEM w/EDX* | The S-4800 is a high-resolution scanning electron microscope (SEM) with cold field emission gun. With a maximum resolution of 1-2nm, it is equipped with energy-dispersive X-ray spectroscopy (EDS). | L110 Cleanroom | 20.00 | 10.00 |
| Zeiss EVO LS SEM | Zeiss EVO LS10 is a variable pressure scanning electron microscope (VP-SEM), Capable of 6nm resolution in high vacuum mode. In extended pressure mode, imaging can be done at set pressures up to 3000 Pa. If used in conjunction with the Deben CoolStage II, biological and other wet samples may be imaged using the variable pressure secondary electron (VPSE) or backscatter detectors. Elemental analysis using the Oxford Inca EDX can be done in all modes. | L110N BioCleanroom | 80.00 | 40.00 |
| Zeiss - Axio Observer A1 | The Observer A1 is an upright compound microscope that is fully equipped four channel wide-field fluorescence, bright-field, dark-field and polarized light microscopy. | L102 NanoBiology Lab | 40.00 | 20.00 |
| Zeiss Z1 Spinning Disk Confocal | Zeiss Axio Observer Spinning Disc Confocal microscope has objectives ranging from 10X-100X and provides four channel laser excitation capability from the near UV into the near infrared range. In addition, the stage mounted temperature controlled CO2 chamber is capable of long term live cell imaging. | L207 Shared Microscope Lab | 61.00 | 30.50 |
| Evident FV3000 Confocal Microscope | The Evident FV3000 has highly efficient and accurate TruSpectral detection on all channels. It is optimized for live cell imaging with high sensitivity and low phototoxicity. | BL02B Helium Ion Microscope Lab | 80.00 | 40.00 |
| Buehler MetaServ 250 Grinder-Polisher | This instrument is used for metallographic specimen preparation. | BL04 Sample Prep Lab | 20.00 | 10.00 |
| Asylum MFP-3D Origin+ AFM | This instrument is capable of nanomechanical, nanoelectrical and electromechanical characterization. | BL03 AFM Lab | 73.00 | 36.50 |
| Thermo 325a Rotary Microtome | This instrument is capable of cutting high-quality paraffin sections for tissue processing. | BL04 Sample Prep Lab | 30.00 | 15.00 |
Whether you want to determine chemical structure or quantify trace elements, JSIRT offers access to a suite of analytical tools and resources including equipment training, remote material analysis and process consultations. JSIRT provides expert-driven analysis through skilled research staff to address the needs of academic, industry and government users.
If a JSNN Technical Staff member is completing service work for a user, a per-hour service (labor) fee is added onto the per hour instrumentation fee. The service (labor) rate is $100 per hour for Industry users and $50 per hour for Academic/Government users.
Click the Full Equipment Listing Link to find the full listing of Analytical Chemistry tools and resources.
JSIRT provides material testing resources for aerospace, automotive, textile, chemical, analytical and physical testing applications. In addition to testing services, JSIRT provides research and consulting services. JSIRT specializes particularly in polymer matrix fiber reinforced composites and textiles.
If a JSNN Technical Staff member is completing service work for a user, a per-hour service (labor) fee is added onto the per hour instrumentation fee. The service (labor) rate is $100 per hour for Industry users and $50 per hour for Academic/Government users.
Click the Full Equipment Listing Link to find the full listing of Materials Testing tools and resources.
JSIRT offers access to a suite of cleanroom micro/nanofabrication and material synthesis tools and resources, including equipment training, remote service, material analysis and consultations. JSNN provides expert-driven process development and analysis through skilled research staff to address the needs of academic, industry and government users.
If a JSNN Technical Staff member is completing service work for a user, a per-hour service (labor) fee is added onto the per hour instrumentation fee. The service (labor) rate is $100 per hour for Industry users and $50 per hour for Academic/Government users.
Note: Tools in the cleanroom will incur cleanroom use fees in addition to instrumentation rates, if applicable.
Click the Full Equipment Listing Link to find the full listing of Micro and Nanofabrication tools and resources.
There are other resources available through JSIRT. Click the Full Equipment Listing Link to find the full listing of additional tools and resources.
If a JSNN Technical Staff member is completing service work for a user, a per-hour service (labor) fee is added onto the per hour instrumentation fee. The service (labor) rate is $100 per hour for Industry users and $50 per hour for Academic/Government users.